Surface Analysis:
High Resolution Imaging:
Analytical Chemistry:
-Please call if a particular technique is not listed, we can usually find it-
- Dynamic Secondary Mass Spectroscopy (SIMS)
- Quadruple Secondary Mass Spectroscopy (SIMS)
- Time-of-Flight Mass Spectroscopy (TOF-SIMS)
- Auger Electron Spectroscopy (AES)
- Electron Spectroscopy for Chemical Analysis (ESCA or XPS)
- Atomic Force Microscopy (AFM)
- X-Ray Diffraction (XRD)
- Rutherford Back Scattering (RBS)
- X-Ray Reflection (XRR)
- X-Ray Diffractions (XRD)
- Micro-Raman - Visible & UV
- EDX
High Resolution Imaging:
- Transmission Electron Microscopy (TEM)
- Neutron Activation (NAA)
- Electron Energy Loss Spectroscopy (EELS)
- FTEM
- STEM
- Focus Ion Beam (FIB)
- Scanning Electron Microscopy (SEM)
Analytical Chemistry:
- Ion Chromatography (IC)
- Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)
- Vapor Phase Deposition (VPD)
- Gas Chromatography Mass Spectrometry (GC-MS)
- Titration
- Inductively Coupled Plasma Optical Emission (ICP-OES)
- Fourier Transform Infrared Spectroscopy (FTIR)
- Assay
-Please call if a particular technique is not listed, we can usually find it-