Technique |
Description |
Typical Application |
Sample Types |
Working Range |
|
High Resolution Inductively Coupled Plasma Mass Spectrometer |
Identify and measure trace metals in aqueous samples |
VPD samples, ultra pure water, process chemicals, material extracts, chemical waste streams |
ppt to ppb |
|
|
Vapor Phase Decomposition |
Collection process used to identify and measure trace metals on wafer surfaces. |
Silicon wafers, thin films |
E7 to E14 atoms/cm2 |
|
|
Inductively Coupled Plasma Optical Emission Spectrometer |
identify and measure trace metals in aqueous samples |
water, chemicals, material extracts, slurries, chemical waste streams |
ppb to ppm |
|
|
Wavelength Dispersive X-Ray Fluorescence Spectrometer |
qualitative and quantitative elemental analysis of solid materials |
Identify unknowns, elemental bulk analysis, thin films composition, contaminant studies |
ppm to wt% |
|
|
Micro Fourier Transform Infrared Spectrometer |
identification of organic and inorganic compounds |
Identify molecular composition of organic materials and polymers, characterize thin films, analyze non-reactive gases |
wt% |
|
|
Thermal Desorb Gas Chromatograph Mass Spectrometer |
qualitative and quantitative analysis of organic compounds and mixtures |
solvents, air samples, process chemicals, water, polymers, wafers |
ppb to wt% |
|
|
Total Organic Carbon Analyzer |
inorganic and organic carbon determinations in aqueous samples |
water, water extracts |
0.1 to 10ppm |
|
|
Potentiometry based autotitration systems |
acid/base/chemical assays water content in organic solvents |
process chemicals, cleaning baths, chemicals waste streams |
0.1 to 10ppm |